Instruments for measuring polarization-related parameters have traditionally been mechanical in nature. Hudson Research Inc is pleased to announce the next generation of solid-state polarization measuring instruments. These instruments all use proprietary electro-optical technology to replace cumbersome and unreliable mechanical components with compact high-speed electro-optic polarization devices.

• Ellipsometer
• Polarimeter
• Scatterometer
• Semiconductor Process Instruments

Ellipsometer

Hudson Research is now offering its Solid State Ellipsometer. This state of the art instrument represents the next generation in ellipsometry and incorporates proprietary electro-optic variable polarization and phase components. Its response time is fast enough for real-time semiconductor and thin-film process control application.

• 

  Figure 1 Solid-State Ellipsometer

  CONTACT US For further Information

  TOP

  Polarimeter

  

  Figure 2 Solid-State Polarimeter

  CONTACT US For further Information

  TOP

  Scatterometer

  

  Figure 3 Solid-State Scatterometer

  CONTACT US For further Information

  TOP

  Semiconductor Process Instruments

  CONTACT US For further Information

  TOP